SoC Design · Test · Reliability
Design Tomorrow,
SoC Design and Test Laboratory
The SoC Design and Test Laboratory focuses on the research about the VLSI/SoC design issues and architecture challenges for intelligent, automotive and mobile systems. Our research interests lie primarily in the area of VLSI/SoC testing, IC reliability and hardware security.
Building reliable semiconductor systems from circuit to test methodology
Our research connects VLSI design, production testing, memory repair, security, and reliability to address practical challenges in high-performance and safety-critical semiconductor systems.
Explore Our Work
Research Area
VLSI/SoC/3D IC design, testing, hardware security, and memory repair.
Projects
Government and industry projects for semiconductor test and reliability.
Journals
Refereed journal publications in SoC, test, memory, and security.
Patents
Patent portfolios for semiconductor design, test, and reliable systems.
Members
Contact Us
We are currently looking for highly motivated M.S./Ph.D. students and undergraduate researchers.
If you are interested in joining my research group, please contact Prof. Lee either by email or phone to schedule an appointment.
Interviews are only available for applicants from other universities who wish to pursue an integrated or doctoral program.
시스템 반도체 설계 및 테스트 연구실에서는 현재 대학원생과 학부 연구원을 모집하고 있습니다.
본 연구에 관심이 있는 학생들은 이영우 교수 이메일 또는 전화를 통한 약속 후 면담을 진행하시길 바랍니다.
단, 타대생은 통합과정 또는 박사과정 진학을 희망하는 경우에 면담 진행이 가능합니다.
Email: yw.lee@inha.ac.kr
Tel: 032-860-7351
Address: Room 314, Hi-Tech Center, Inha University, Incheon, Republic of Korea